HUATEC GROUP CORPORATION
HUATEC GROUP CORPORATION Professional Non Destructive Testing Equipment
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139 Micron Amorphous Silicon A-Si Curved A-Si DR And Non-Destructive Testing
H3543HWF-AG It is a portable wireless flat detector based on amorphous silicon surface sensor, suitable for pipeline inspection, industrial inspection, non-destructive testing and other fields
Sensor
Receptor Type a-Si
Scintillator Gos
Active Area 350 x 430 mm
Resolution 2560 x 3072
Pixel Pitch 139 μm
Power Supply & Battery
Adapter In AC 100-240V,50-60Hz
Adapter Out DC 24V,2.7A
Power Dissipation <20 W
Battery working time 6.5 h
Charging time 4.5 h
Image Quality
Limiting Resolution 3.5 LP/mm
Energy Range 40-350 KV
Dynamic Range ≥84 dB
Sensitivity ≥0.54 LSB/nGy
Ghos <1% 1st frame
DQE 42% @(1 LP/mm)
28% @(2 LP/mm)
MTF) 68% @(1 LP/mm)
38% @(2 LP/mm)
20% @(3 LP/mm)
Electricals and interface
A/D Conversion 16 bits
Data Interface Gigabit Ethernet/802.11ac 5G
Acquire Time wired: 1s; wireless: 2s
Exposure Control Software/outsside
Inbuilt memory 4 GB DDR4, 8 GB SD card
Mechanical
Dimension 583x437x21.8mm
Weight 4.5kg
Material Aluminum and magnesium alloys
Front Panel Carbon fiber
Enviromental
Temperature 10-35°C (operating)；-10~50°C (storage)
Humidity 30-70% RH (non-condensing)
Ingress Protection IP54