HUATEC GROUP CORPORATION
HUATEC GROUP CORPORATION Professional Non Destructive Testing Equipment
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100 Micron Amorphous Silicon A-Si For Various Fields Such As DR And Non-Destructive Testing
3025DA-AG is a light weight detector based on amorphous silicon(a-Si), which is suitable for Non-destructive testing.
Sensor
Receptor Type a-Si
Scintillator Gos / CsI:TI
Active Area 300 x 254 mm
Resolution 2560 x 3072
Pixel Pitch 100 μm
Power Supply & Battery
Adapter In AC 100-240V,50-60Hz
Adapter Out DC 24V,2.7A
Power Dissipation <20 W
Image Quality
Limiting Resolution 3.5 LP/mm
Energy Range 40-160 KV
Dynamic Range ≥84 dB
Sensitivity ≥0.54 LSB/nGy
Ghos <1% 1st frame
DQE 42% @(1 LP/mm)
28% @(2 LP/mm)
MTF 68% @(1 LP/mm)
38% @(2 LP/mm)
20% @(3 LP/mm)
Electricals and interface
A/D Conversion 16 bits
Data Interface Gigabit Ethernet
Frame rate 1x1 5fps/2x2 15fps/3x3 25fps
Exposure Control Free Run/SYNC Acquire
Mechanical
Dimension 384 × 460 × 14.8 mm
Weight 3.4kg
Material Aluminum and magnesium alloys
Front Panel Carbon fiber
Enviromental
Temperature 10-35°C (operating)；-10~50°C (storage)
Humidity 30-70% RH (non-condensing)
Ingress Protection IP51