HUATEC GROUP CORPORATION

HUATEC GROUP CORPORATION Professional Non Destructive Testing Equipment

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139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing

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HUATEC GROUP CORPORATION
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City:beijing
Province/State:beijing
Contact Person:MrJingAn Chen
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139 Micron Amorphous Silicon A Si For Various Fields Such As DR Non-Destructive Testing

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Brand Name :HUATEC
Model Number :H3543HWC-EG
Certification :CE ISO GOST
Place of Origin :China
MOQ :1
Packaging Details :export standard carton package
Material :amorphous silicon sensor
Temperature :10-35°C (operating);-10~50°C (storage)
Humidity :30-70% RH (non-condensing)
Product name :DR Digital Flat Panel Detector
Receptor Type :a-Si
Scintillator :Gos / CsI:TI
Active Area :350 x 430 mm
Pixel Pitch :139 μm
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139 Micron Amorphous Silicon A-Si For Various Fields Such As DR And Non-Destructive Testing

H3543HWC-EG is a lightweight wireless detector based on amorphous silicon(a-Si), which is suitable for various fields such as DR and Non-destructive testing.

Sensor
Receptor Type a-Si

Scintillator Gos / CsI:TI

Active Area 350 x 430 mm

Resolution 2560 x 3072

Pixel Pitch 139 μm

Power Supply & Battery

Adapter In AC 100-240V,50-60Hz

Adapter Out DC 24V,2.7A

Power Dissipation <20 W

Standby Time 6.5 h

Recharge Time 4.5 h

Image Quality
Limiting Resolution 5 LP/mm

Energy Range 40-160 KV

Dynamic Range ≥76 dB

Sensitivity ≥0.36 LSB/nGy

Ghos <1% 1st frame

DQE 38% @(1 LP/mm)

21% @(2 LP/mm)

MTF 75% @(1 LP/mm)

48% @(2 LP/mm)

28% @(3 LP/mm)

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